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美国ELECTROMATIC TI-PVX超声波测厚仪- 详细介绍：
美国ELECTROMATIC TI-PVX超声波测厚仪
It's ability to use a variety of single element transducers for specific applications: Standard Delay Line (acrylic and graphite tips for metals and thin plastics), Pencil Delay Line (tough access area on thin materials), and Contact transducers (variety of applications) makes it the perfect flexibel tool for very precise and delicate measurements. The adjustable resolution settings add to the PVX’s flexibilty.
The selectable viewing options provide the user with additional flexibility during operation: (RF waveform, +/- Rectified waveform, and Large Digits with Scan Bar.
The time based B-Scan feature displays a cross section of the test material. Displays the profile of the opposite surface of the material.
The high speed scan feature speeds up the inspection process by making 32 measurements per second. Remove transducer from the test material and display the minimum measurement scanned.
Features
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